Scanning Probe Microscopy: Atomic Force: Microsc...

To translate this physical bending into data, a laser beam is reflected off the back of the cantilever onto a . Even minute movements of the tip shift the laser’s path, which the detector records to generate a precise 3D topographic map of the surface. Primary Imaging Modes

Atomic force microscope (AFM), the key tool for surface analysis Scanning Probe Microscopy: Atomic Force Microsc...

At its core, an AFM operates much like a record player. It uses a microscopic probe, usually made of silicon or silicon nitride, attached to a flexible cantilever. As the probe scans across a surface, atomic-scale forces (such as , electrostatic, or capillary forces) cause the cantilever to bend or vibrate. Licensed by Google To translate this physical bending into data, a

AFM can be operated in several modes depending on the delicacy of the sample and the information required: It uses a microscopic probe, usually made of

The tip is dragged directly across the surface. While it provides high-resolution data for hard materials, the frictional forces can damage soft biological samples.

AFM’s ability to work in various environments—including air, vacuum, and liquids—has led to breakthroughs in several fields: