The tip can be used as a "pen" to move individual molecules or etch patterns into a surface, enabling bottom-up nanofabrication . 4. Why Use AFM Over SEM? Unlike Scanning Electron Microscopy (SEM), AFM:
To prevent the tip from crashing or losing contact, a piezoelectric scanner adjusts the height of the sample or the tip in real-time to maintain a constant force. This vertical movement is what creates the 3D topographic map. 2. Primary Imaging Modes
As the tip scanned across a surface, atomic forces (like Van der Waals, electrostatic, or capillary forces) cause the cantilever to deflect.
The tip "drags" across the surface. It provides high resolution but can damage soft samples like biological tissues.
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The tip can be used as a "pen" to move individual molecules or etch patterns into a surface, enabling bottom-up nanofabrication . 4. Why Use AFM Over SEM? Unlike Scanning Electron Microscopy (SEM), AFM:
To prevent the tip from crashing or losing contact, a piezoelectric scanner adjusts the height of the sample or the tip in real-time to maintain a constant force. This vertical movement is what creates the 3D topographic map. 2. Primary Imaging Modes
As the tip scanned across a surface, atomic forces (like Van der Waals, electrostatic, or capillary forces) cause the cantilever to deflect.
The tip "drags" across the surface. It provides high resolution but can damage soft samples like biological tissues.